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Application Note 9707
HI5805 Performance Characterization
TABLE 3. HI5805 PIN DESCRIPTION
Dynamic testing is used to evaluate the performance of the
PIN NO.
NAME
DESCRIPTION
HI5805 A/D converter. Among the tests performed are Signal-
to-Noise and Distortion Ratio (SINAD), Signal-to-Noise Ratio
(SNR), Total Harmonic Distortion (THD), Spurious Free
Dynamic Range (SFDR) and Intermodulation Distortion (IMD).
Figure 6 shows the test system used to perform dynamic
testing on high-speed ADCs at Intersil. The clock (CLK) and
analog input (V IN ) signals are sourced from low phase noise
HP8662A synthesized signal generators that are phase locked
1
2
3
4
5
CLK
DV CC1
D GND1
DV CC1
D GND1
Input Clock
Digital Supply (5.0V)
Digital Ground
Digital Supply (5.0V)
Digital Ground
to each other to ensure coherence. The output of the signal
generator driving the ADC analog input is bandpass filtered to
improve the harmonic distortion of the analog input signal. The
comparator on the evaluation board will convert the sine wave
CLK input signal to a square wave at TTL logic levels to drive
6
7
8
AV CC
A GND
V IN+
Analog Supply (5.0V)
Analog Ground
Positive Analog Input
the sample clock input of the HI5805. The ADC data is
captured by a logic analyzer and then transferred over the GPIB
bus to the PC. The PC has the required software to perform the
Fast Fourier Transform (FFT) and do the data analysis.
Coherent testing is recommended in order to avoid the
inaccuracies of windowing. The sampling frequency and
analog input frequency have the following relationship: F I /F S
= M/N, where F I is the frequency of the input analog
sinusoid, F S is the sampling frequency, N is the number of
samples, and M is the number of cycles over which the
samples are taken. By making M an integer and odd number
9
10
11
12
13
14
15
V IN-
V DC
V ROUT
V RIN
A GND
AV CC
D11
Negative Analog Input
DC Bias Voltage Output
Reference Voltage Output
Reference Voltage Input
Analog Ground
Analog Supply (5.0V)
Data Bit 11 Output (MSB)
(1, 3, 5, ...) the samples are assured of being nonrepetitive.
Refer to the HI5805 data sheet for a complete list of test
de?nitions and the results that can be expected using the
16
17
D10
D9
Data Bit 10 Output
Data Bit 9 Output
evaluation board with the test setup shown. Evaluating the
part with a reconstruction DAC is only suggested when
doing bandwidth or video testing.
18
19
D8
D7
Data Bit 8 Output
Data Bit 7 Output
HP8662A
REF
HP8662A
20
D6
Data Bit 6 Output
21
D GND2
Digital Output Ground
BANDPASS
FILTER
22
23
DV CC2
D5
Digital Output Supply (3.0V to 5.0V)
Data Bit 5 Output
CLK
V IN
24
D4
Data Bit 4 Output
COMPARATOR
V IN
HI5805
CLK
DIGITAL DATA OUTPUT
25
26
D3
D2
Data Bit 3 Output
Data Bit 2 Output
HI5805EVAL1
EVALUATION BOARD
10
27
28
D1
D0
Data Bit 1 Output
Data Bit 0 Output (LSB)
DAS9200
GPIB
PC
12-BIT DAC
OSCILLOSCOPE
FIGURE 6. HIGH-SPEED A/D PERFORMANCE TEST SYSTEM
3-6
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相关代理商/技术参数
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HI5808BIB 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 9MSPS A/D Converter
HI5808BIBR4499 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Harris Corporation 功能描述:
HI5808BIBS2503 制造商:Rochester Electronics LLC 功能描述:- Bulk
HI5808EVAL1 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:12-Bit, 10 MSPS A/D Converter
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